TAM: Test Analysis Modules
Alexander Robitzsch; Thomas Kiefer; Margaret Wu; Ivor W. Molenaar
Includes marginal maximum likelihood estimation and joint maximum likelihood estimation for unidimensional and multidimensional item response models. The package functionality covers the Rasch model, 2PL model, 3PL model, generalized partial credit model, multi-faceted Rasch model, nominal item response model, structured latent class model, mixture distribution IRT models, and located latent class models. Latent regression models and plausible value imputation are also supported. For details see Adams, Wilson and Wang, 1997 <<a href="https://doi.org/10.1177%2F0146621697211001" target="_top">doi:10.1177/0146621697211001</a>>, Adams, Wilson and Wu, 1997 <<a href="https://doi.org/10.3102%2F10769986022001047" target="_top">doi:10.3102/10769986022001047</a>>, Formann, 1982 <<a href="https://doi.org/10.1002%2Fbimj.4710240209" target="_top">doi:10.1002/bimj.4710240209</a>>, Fo...
Alexander Robitzsch, Thomas Kiefer, Margaret Wu, & Ivor W. Molenaar (2013). TAM: Test Analysis Modules. CRAN: Contributed Packages. https://doi.org/10.32614/cran.package.tam