Gavin W. Fulmer
Nanyang Technological University
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Is it harder to know or to reason? Analyzing two-tier science assessment items using the Rasch measurement model
Gavin W. Fulmer; Hye‐Eun Chu; David F. Treagust; Knut Neumann
Asia-Pacific Science Education
Vol. 1 · Issue No. 1
DIFCATEducationPsychology
40 citationsView record